Atomic Force Microscopy
Atomic Force Microscopy
Select locations
Select company type
Select type
Select industries
Select industry
Number of employees
Min.
Max.
Founding year
Lock keywords
Exclude keywords
Define optional keywords
Atomic Force Microscopy (AFM) is a type of scanning probe microscopy that enables the imaging of surfaces at the atomic level. It utilizes a cantilever with a sharp tip (probe) to detect and measure the tiny forces that exist between the tip and the sample surface. The tip is scanned across the surface of the sample and the deflection of the cantilever is measured, allowing the user to build up a three-dimensional map of the surface. AFM can be used to measure topography, adhesion, friction, electrical properties, and other properties of the surface down to the nanometer scale.
... Upgrades & Refurbs for AFMWorkshop Customers #57 Graphene Council hosted a webinar featuring AFMWorkshop's Paul West #56 AFM Calibration for 2D Materials #55 What can Atomic Force Microscopy do for you? ...
... Home / News / What can Atomic Force Microscopy do for you? ...
... AFM (Atomic Force Microscopy) ...
... AFM (Atomic Force Microscopy) ...
... Atomic Force Microscopy (AFM) Auger Electron Spectroscopy (AES) Confocal Laser Scanning Microscopy (CLSM) Contact Angle Corrosion and Electrochemistry Differential Scanning Calorimetry (DSC) Dynamic SIMS (D-SIMS) Fourier Transform Infrared Spectroscopy (FTIR) Laser Raman ...
... Using our knowledge as well as our high precision AFM Probes, our clients are able to get the best results they need for atomic force microscopy (AFM). ...
... Find brief introductions to how atomic force microscopy is advancing research in many different ...
... The atomic force microscopy consists in a micro scale cantilever with a sharp tip at its end that is used to scan the surface sample. ...
... There you will find information not only about how this self-sensing and self-actuating probe for Atomic Force Microscopy works but also about the required set-up and electrical configuration and a lot more. ...
... Angstrom Science was created in order to pursue a single idea: Atomic Force Microscopy can be improved dramatically by making it work with optical microscopes, not compete with them. Each of the three main types of microscope has its own strengths and weaknesses and we feel that by making ...
