Atomic Force Microscopy (AFM) is a type of scanning probe microscopy that enables the imaging of surfaces at the atomic level. It utilizes a cantilever with a sharp tip (probe) to detect and measure the tiny forces that exist between the tip and the sample surface. The tip is scanned across the surface of the sample and the deflection of the cantilever is measured, allowing the user to build up a three-dimensional map of the surface. AFM can be used to measure topography, adhesion, friction, electrical properties, and other properties of the surface down to the nanometer scale.