Ellipsometry
Ellipsometry

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Products and services for "Ellipsometry"

Image for Ellipsometry Measurement | Laboratory Analysis | Measurlabs
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Ellipsometry Measurement | Laboratory Analysis | Measurlabs

This ellipsometry measurement is suitable for single and multi-layer thin films with a thickness between 1 nm and 1 μm.

by Measurlabs

Image for Ellipsometry EC - Ellipsometry Electrochemical Cell, angle of incidence 70 deg  | affordable research equipment
Product

Verified

Ellipsometry EC - Ellipsometry Electrochemical Cell, angle of incidence 70 deg | affordable research equipment

This cell combines two classical analytical techniques such as electrochemistry and reflective ellipsometry, to obtain in-situ change in phase and amplitude between the p-polarized and s-polarized components of the incident and reflected monochromatic light during the electrochemical process. This combination offers di

by redox.me

Image for Large & Inline Ellipsometry Systems, VVRM systems | Axometrics
Product

Verified

Large & Inline Ellipsometry Systems, VVRM systems | Axometrics

Optical measurement solutions for LCD manufacturers' production and R&D laboratories. Axometrics is the leader in Mueller matrix measurement systems for determining the polarization properties of materials.

by Axometrics

Image for Ellipsometry Module - Emphor Life Analytical Science
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Ellipsometry Module - Emphor Life Analytical Science

The Q-Sense Ellipsometry Module enables simultaneous QCM-D and ellipsometry measurements on the same substrate. As the complexity of systems under study increases, one technique alone may not provide all the required information. Merging several techniques into the same setup and monitoring events on the same surface may provide complementary information and enable a more complete …

by ADVANCE TECHNOLOGY FOR MODERN BUSINESS LLC

Image for Spectroscopic Ellipsometry - HORIBA
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Spectroscopic Ellipsometry - HORIBA

Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique used for thin layers and surface characterization. Discover our solutions.

by HORIBA

Image for Spectroscopic Ellipsometry - HORIBA
Product

Verified

Spectroscopic Ellipsometry - HORIBA

Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique used for thin layers and surface characterization. Discover our solutions.

by HORIBA

Image for Advantages of spectroscopic ellipsometry - HORIBA
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Verified

Advantages of spectroscopic ellipsometry - HORIBA

Advantages of spectroscopic ellipsometry | What are the advantages of spectroscopic ellipsometry? | What types of materials can be measured with spectroscopic ellipsometry? | What thickness range can spectroscopic ellipsometry measure? | What spectral range do HORIBA Scientific’s ellipsometers cover? | What can we learn from the NIR region? | What can we learn from the FUV region? | What is the difference between spectroscopic ellipsometry and reflectometry? | Should I choose reflectometry or ellipsometry for thickness measurements? | What are the application fields of spectroscopic ellipsometry?

by HORIBA

Image for Spectroscopic Ellipsometry: Basic Concepts - HORIBA
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Verified

Spectroscopic Ellipsometry: Basic Concepts - HORIBA

Spectroscopic ellipsometry is a non-destructive, noncontact, and non-invasive optical technique which is based on the change in the polarization state of light as it is reflected obliquely from a thin film sample.

by HORIBA

Image for Advantages of spectroscopic ellipsometry - HORIBA
Product

Verified

Advantages of spectroscopic ellipsometry - HORIBA

Advantages of spectroscopic ellipsometry | What are the advantages of spectroscopic ellipsometry? | What types of materials can be measured with spectroscopic ellipsometry? | What thickness range can spectroscopic ellipsometry measure? | What spectral range do HORIBA Scientific’s ellipsometers cover? | What can we learn from the NIR region? | What can we learn from the FUV region? | What is the difference between spectroscopic ellipsometry and reflectometry? | Should I choose reflectometry or ellipsometry for thickness measurements? | What are the application fields of spectroscopic ellipsometry?

by HORIBA

Image for Spectroscopic Ellipsometry: Basic Concepts - HORIBA
Product

Verified

Spectroscopic Ellipsometry: Basic Concepts - HORIBA

Spectroscopic ellipsometry is a non-destructive, noncontact, and non-invasive optical technique which is based on the change in the polarization state of light as it is reflected obliquely from a thin film sample.

by HORIBA

14 companies for "Ellipsometry"

Accurion GmbH's Logo

Göttingen, Germany

11-50 Employees

1991

Park Systems was established in 1997 with the mission to equip scientists and engineers with the most advanced AFM systems that enable them to see, measure and characterize things at the highest nanoscale resolution and accuracy. We are always interested in recruiting qualified candidates interested in joining our growing team, especially in the areas of engineering, sales, marketing, and technical support. Accurion develops and manufactures advanced solutions for challenging measurement tasks with its two divisions thin film characterization and active vibration isolation. We provide active vibration isolation systems to remove ambient vibrations from sensitive measuring equipment for more precise results. The leading innovator of nanoscale microscopy and metrology solutions. Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance. Park Systems provides a full range of AFM and related products to those in the chemistry, materials, physics, life sciences, and semiconductor industries. Since the time of its foundation, Park Systems has delivered on its promise with numerous innovations, including True Non-Contact Imaging, 3D metrology, and fully automated AFM systems for both research and industrial applications.

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Image for Ellipsometry Accessories

Ellipsometry Accessories

... Ellipsometry ...

Axometrics's Logo

Huntsville, United States

1-10 Employees

2002

Axometrics has become a global leader in polarization testing equipment manufacturing. We produce optical measuring tools in sizes to match the products they test, and they are used in applications ranging from tiniest smart phone lenses to the largest LCD panel substrates being made. The company was founded by recognized experts in the field of polarization measurement, Matthew H. Our systems provide full Mueller matrix polarization testing capability to customers ranging from flat panel display manufacturers to heart valve manufacturers. AxoScan is the fastest and most powerful polarization measurement tool available, and is trusted around the world to test polarization-critical components.Learn More ⟶.

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Product
Image for Large & Inline Ellipsometry Systems

Large & Inline Ellipsometry Systems

... Large & Inline Ellipsometry Systems, VVRM systems | ...

HORIBA's Logo

Kyoto, Japan

5001-10000 Employees

1945

The HORIBA Group of worldwide companies provides an extensive array of instruments and systems for applications ranging from automotive R&D, process and environmental monitoring, in-vitro medical diagnostics, semiconductor manufacturing and metrology, to a broad range of scientific R&D and QC measurements. HORIBA Automotive provides innovative applications and insights, advanced automotive validation and…. HORIBA Medical designs, develops and distributes worldwide, in vitro diagnostic systems mainly…. HORIBA Process and Environmental provides a wide range of technologies to measure air, water and…. HORIBA Semiconductor have developed a line-up of fluid control, vaporization, analytical equipment…. HORIBA Scientific offers 200 years of experience in developing high-performance scientific…. HORIBA water and liquid analysis technology is based on 75 years’ experience since the foundation of…. Since establishing HORIBA RADIO LABORATORY in Japan in 1945, HORIBA has grown as an R&D company and engaged in international operations, making the most of its experiences and encounters with people along the way.

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Image for Spectroscopic Ellipsometry

Spectroscopic Ellipsometry

... Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique used for thin layers and surface characterization. Discover our solutions. ...

ADVANCE TECHNOLOGY FOR MODERN BUSINESS LLC's Logo

Muscat, Oman

1-10 Employees

2013

Ever since its inception, Emphor DLAS has spearheaded the development and application of Life and Analytical Science in various industries across the Middle East Region. Emphor DLAS helps customers transform data into informed decisions and accelerated insights. A technology house that exceeds customer expectations by innovative and adaptive engineering practices.

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Featured

Product
Image for Ellipsometry Module

Ellipsometry Module

... The Q-Sense Ellipsometry Module enables simultaneous QCM-D and ellipsometry measurements on the same substrate. As the complexity of systems under study increases, one technique alone may not provide all the required information. Merging several techniques into the same setup and ...

PVD Products's Logo

Wilmington, United States

11-50 Employees

1995

We provide end-to-end support, from design through installation and continuing maintenance. Greer founded PVD Products in 1995 to build large-area pulsed laser deposition (PLD) systems. Located just outside of Boston in Wilmington, MA, today PVD Products occupies a modern 17,000 square foot manufacturing facility. Our team of experienced engineers and technicians is passionate about finding the best solution to your unique deposition system demands. Consider the PVD Products team to help you reach your next research goal or product demand. Research and development is what inspires PVD Products day in and day out. Our collaborative approach allows PVD Products to meet the research needs of high profile universities, national labs, and small and large corporations around the world, including places such as MIT and NIST. Starting up or scaling up, PVD Products is your thin film deposition system partner.

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Service
Image for Scanning Ellipsometry Services

Scanning Ellipsometry Services

... Mapping Ellipsometry is one of several thin film services offered by PVD Products. ...

redox.me's Logo

Norrköping, Sweden

1-10 Employees

2015

Redoxme AB was founded in July 2015 in Sweden. We provide laboratory instrumentation that enables simultaneous in-situ measurements of a number of signals (electrochemical, optical, thermal and other) on thin film and membrane materials. So what we are actually doing is creating an added value for existing laboratory facilities. In practice we are taking needs and opinions of scientist to create new methods that actually benefit to whole research community. We provide custom equipment design and fabrication solutions to meet specification of an individual research topic. R/T/A Spectro-EC 1.75 mL - Reflection / Transmission / Absorption Spectro-Electrochemical Cell. We can also customize any product listed above to enable application of different electrode or sample geometry.

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Image for Ellipsometry EC - Ellipsometry Electrochemical Cell, angle of incidence 70 deg

Ellipsometry EC - Ellipsometry Electrochemical Cell, angle of incidence 70 deg

... This cell combines two classical analytical techniques such as electrochemistry and reflective ellipsometry, to obtain in-situ change in phase and amplitude between the p-polarized and s-polarized components of the incident and reflected monochromatic light during the electrochemical process. ...

Measurlabs's Logo

Helsinki, Finland

11-50 Employees

2017

Our goal is to make buying measurements easy, quick, and hassle-free. Measurlabs was founded in 2017 with the mission to change this. The Measurlabs team consists of highly qualified chemists and material scientists. We are a tightly knit group of PhDs and MScs, with expertise covering these areas, to mention just a few:. Getting the testing services you need is a crucial part of any product development process. To offer our customers an even more comprehensive selection of services, we are continuously on the lookout for more partners. In the case of more complex testing projects, we provide expert help and guidance throughout the process. Offering every measurement you need in the same place – from abrasion resistance to zeta potential.

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Image for Ellipsometry measurement

Ellipsometry measurement

... This ellipsometry measurement is suitable for single and multi-layer thin films with a thickness between 1 nm and 1 μm. ...

Onto Innovation's Logo

Wilmington, United States

1001-5000 Employees

2019

We combine the scale of a global leader with an expanded portfolio of leading-edge technologies that include: unpatterned wafer quality; 3D metrology spanning the chip from nanometer-scale transistors to micron-level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging. Onto Innovation’s software brings understanding of how individual processes affect the overall product, enabling customers to improve product quality and reliability. Nanometrics was founded in 1975 and is the pioneer and innovator in the field of optical metrology. Nanometrics has an extensive installed base of more than 6,500 systems in over 150 production factories worldwide. Rudolph and Sons in 1940 and later introduced the semiconductor industry's first production-oriented ellipsometer for thin film measurements in 1977. Rudolph became a public company in 1999 and expanded its portfolio to offer a full range of solutions including thin film metrology, defect inspection, enterprise software, and also lithography for advanced packaging applications. Metrology, defect inspection, lithography, and smart manufacturing software solutions for semiconductor manufacturers to accelerate product and process development, increase yields and reduce costs to enable customers to be first-to-market with premium products at premium prices. Bare wafer manufacturers provide the quality silicon wafers needed for today's semiconductor manufacturing.

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Image for 
                                    OCD Solutions
                    -
                Onto Innovation

OCD Solutions - Onto Innovation

... New Advances in Mid-Infrared Critical Dimension Ellipsometry and Machine ...

Eisenberg Bros Ltd.'s Logo

Tzafria, Israel

11-50 Employees

1952

At Eisenberg, we work closely with our global suppliers to deliver best-in-class solutions to our customers. Through our customer-centric approach and by building long-term relationships with our clients, we can deliver tailored solutions for the rapidly evolving needs of the modern market.

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Image for Temperature and environmental control stages - Eisenberg Bros LTD

Temperature and environmental control stages - Eisenberg Bros LTD

... Temperature Control Stages with a Vacuum Chamber, Electrical And Probe stages, Freeze Drying Systems, Mechanical Testing, We also have stages tailored to specific techniques such as Raman, FTIR, ellipsometry, X-ray and many more. ...

conceptualized.tech's Logo

Norrköping, Sweden

1-10 Employees

2017

We believe you are an organization with a need to clarify a complex product, a procedural flow for your employees or want to create accurate sales tools with flare. We offer you global solutions with high-end interactive presentation tools, videos and animations and web development. We firmly believe that all customers prefer comprehensive products and services, no matter if they are your colleagues or your next sales lead. We offer you to take your linear stories into interactive presentation tools with eye candy fit for your company profile. Our passion for creating drove us to provide a professional service to help others with this endeavour. We offer ways of displaying your ideas, products and results through beautiful and informative images, videos and interactive presentation tools. Pelle Janson is a PhD student in Bioelectronics and loves telling stories no matter through what medium. We have now released some more products on the Blender Market!

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Image for technology – conceptualized.tech

technology – conceptualized.tech

... Ellipsometry report published with Cover Art! ...

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„Ellipsometry“

Ellipsometry is a non-destructive optical technique used to measure the optical properties of a surface. It is used to measure the thickness, refractive index, and optical constants of materials and surfaces. The technique works by illuminating a sample surface with polarized light and measuring the changes in polarization as the light reflects off the surface. This data can then be used to infer the thickness and optical properties of the material.