Focused Ion Beam
Focused Ion Beam

Filter

Select locations

Select company type

Select industries

Number of employees

to

Founding year

to


Lock keywords

Exclude keywords

Define optional keywords

Clear filters
408 Results
Show More

„Focused Ion Beam“

Focused Ion Beam (FIB) is a technique used to precisely mill, deposit, and analyze the structure of semiconductor materials. It utilizes a beam of ions to remove, deposit, and analyze material from a sample surface with sub-micrometer precision. FIB is used for a variety of applications such as semiconductor device fabrication, material analysis, and imaging.

JEOL (Germany) GMBH's Logo

JEOL (Germany) GMBH

Freising, Germany
51-100 Employees

Focused Ion Beam Systeme - JEOL (Germany) GmbH

... Focused Ion Beam SystemeTransmissionselektronenmikroskope (TEM) ...

Norsam Technologies's Logo

Norsam Technologies

Albuquerque, United States
11-50 Employees

Home - Norsam Technologies - Submicron Solutions

... For example, the piece at the right was sculpted from a particle of diamond dust using focused ion beam (FIB) technology. ...

Home - Norsam Technologies - Submicron Solutions

About Us - Norsam Technologies

... Within two years, 260 New Mexicans invested in the company as well as a large focused ion beam manufacturer. The Company provides microscopic, high … About Us Read More » ...

About Us - Norsam Technologies
Hitachi America's Logo

Hitachi America

United States
10001+ Employees

Scientific Research, Laboratory & Analytical Equipments : Hitachi

... Analytical Systems Electron Microscopes and Focused Ion Beam ...

Scientific Research, Laboratory & Analytical Equipments : Hitachi
El-Mul's Logo

El-Mul

Rishon LeZion, Israel
11-50 Employees

El-Mul – Detect the Difference

... We are serving OEM vendors in the fields of Analytic SEM and TEM, Focused Ion Beam, Mass Spectrometry and Semiconductor Metrology and Inspection e-beam tools. ...

Orsay Physics's Logo

Orsay Physics

Fuveau, France
101-250 Employees

News - Orsay Physics

... Herein, the development of an innovative analytical SIMS implemented in a focused ion beam (FIB) (using Ga source)/scanning electron microscope (SEM) is reported. ...


News - Orsay Physics

... Herein, the development of an innovative analytical SIMS implemented in a focused ion beam (FIB) (using Ga source)/scanning electron microscope (SEM) is reported. ...

ORENCH CONSULTING LLC's Logo

ORENCH CONSULTING LLC

Clermont, United States
1-10 Employees

ORENCH CONSULTING

... Focused Ion Beam (FIB) ...

Hitachi High-Tech's Logo

Hitachi High-Tech

Tokyo, Japan
10001+ Employees

Focused Ion Beam Systems (FIB/FIB-SEM) : Hitachi High-Tech in the U.S.A.

... High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM ...

zeroK NanoTech's Logo

zeroK NanoTech

Gaithersburg, United States

zeroK NanoTech

... We deliver high-performance focused ion beam (FIB) systems for customers ready to move to the next-generation of FIB technology. We can deliver results in your demanding applications. ...


zeroK NanoTech People

... FIB:ZERO is a focused ion beam system employing a brand-new high-performance Cs+ ion source. When compared with Ga+ systems, it provides better resolution, even at at lower beam-energies. Compared with He+ or Ne+ systems, it provides an order of magnitude higher milling rates and reduced ...

Aerospace & Advanced Composites's Logo

Aerospace & Advanced Composites

Wiener Neustadt, Austria
11-50 Employees

Microstructural Analysis - Aerospace

... All detailed information can be downloaded as PDF: Electron Microscopy (SEM) Focused Ion Beam (FIB) Energy Dispersive X-Ray Spectroscopy (EDS) Electron Back-Scattered Diffraction (EBSD) 3D-reconstruction Microstructural Analysis Advanced materials, solution-oriented methods, qualitative ...

Microstructural Analysis - Aerospace

Microstructural Analysis - Aerospace

... All detailed information can be downloaded as PDF: Electron Microscopy (SEM) Focused Ion Beam (FIB) Energy Dispersive X-Ray Spectroscopy (EDS) Electron Back-Scattered Diffraction (EBSD) 3D-reconstruction Microstructural Analysis Advanced materials, solution-oriented methods, qualitative ...

Microstructural Analysis - Aerospace
Neolith Integrated Circuits's Logo

Neolith Integrated Circuits

United States
1-10 Employees

Menu — Neolith

... Focused Ion Beam (FIB) re- ...