Focused Ion Beam
Focused Ion Beam
Select locations
Select company type
Select type
Select industries
Select industry
Number of employees
Min.
Max.
Founding year
Lock keywords
Exclude keywords
Define optional keywords
Focused Ion Beam (FIB) is a technique used to precisely mill, deposit, and analyze the structure of semiconductor materials. It utilizes a beam of ions to remove, deposit, and analyze material from a sample surface with sub-micrometer precision. FIB is used for a variety of applications such as semiconductor device fabrication, material analysis, and imaging.
... Focused Ion Beam SystemeTransmissionselektronenmikroskope (TEM) ...
... For example, the piece at the right was sculpted from a particle of diamond dust using focused ion beam (FIB) technology. ...
... Within two years, 260 New Mexicans invested in the company as well as a large focused ion beam manufacturer. The Company provides microscopic, high … About Us Read More » ...
... Analytical Systems Electron Microscopes and Focused Ion Beam ...
... We are serving OEM vendors in the fields of Analytic SEM and TEM, Focused Ion Beam, Mass Spectrometry and Semiconductor Metrology and Inspection e-beam tools. ...
... Herein, the development of an innovative analytical SIMS implemented in a focused ion beam (FIB) (using Ga source)/scanning electron microscope (SEM) is reported. ...
... Herein, the development of an innovative analytical SIMS implemented in a focused ion beam (FIB) (using Ga source)/scanning electron microscope (SEM) is reported. ...
... Focused Ion Beam (FIB) ...
... High-precision Focused Ion Beam Scanning Electron Microscopes (FIB-SEM) with real-time SEM ...
... We deliver high-performance focused ion beam (FIB) systems for customers ready to move to the next-generation of FIB technology. We can deliver results in your demanding applications. ...
... FIB:ZERO is a focused ion beam system employing a brand-new high-performance Cs+ ion source. When compared with Ga+ systems, it provides better resolution, even at at lower beam-energies. Compared with He+ or Ne+ systems, it provides an order of magnitude higher milling rates and reduced ...
... All detailed information can be downloaded as PDF: Electron Microscopy (SEM) Focused Ion Beam (FIB) Energy Dispersive X-Ray Spectroscopy (EDS) Electron Back-Scattered Diffraction (EBSD) 3D-reconstruction Microstructural Analysis Advanced materials, solution-oriented methods, qualitative ...
... All detailed information can be downloaded as PDF: Electron Microscopy (SEM) Focused Ion Beam (FIB) Energy Dispersive X-Ray Spectroscopy (EDS) Electron Back-Scattered Diffraction (EBSD) 3D-reconstruction Microstructural Analysis Advanced materials, solution-oriented methods, qualitative ...
... Focused Ion Beam (FIB) re- ...
