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Wafer Metrology Tool

Wafer metrology tools are instruments used in the semiconductor industry to measure, inspect, and analyze the characteristics of semiconductor wafers, such as their thickness, flatness, and surface topography. These tools use precision optical, electrical, and mechanical techniques to measure the physical and electrical characteristics of a wafer and its components. The data gathered from the metrology tools is used to ensure that the wafers meet the required specifications for the final product.

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