Applied Research & Photonics, Inc.

Two models are available: (1) TNS3DI-FC, fiber-coupled beam delivery for the most versatility, X, Y = 200 mm standard, up to 450 mm option. The TNS3DI delivers combined capabilities of AFM, SEM, TEM, and Time-domain Spectrometer. TeraSpectra is an innovative Terahertz Nano-Scanning Spectrometer with 3D Imaging system that breaks the spatial resolution limit of current generation optical inspection technologies, and uniquely identifies location and depth where defects exist. ARP provides terahertz nano-scanning material characterization and testing services that helps semiconductor and nano-material researchers and manufacturers, easily visualize and identify using 3-dimensional images, surface and sub-layer defects. TeraSpectra, is our ground breaking and award winning Terahertz Scanning Spectrometer that provides non-contact, non-destructive, ambient temperature testing that offers two key innovations. Currently, there is no measurement technology that has the capability to provide an equivalent richness of information that our TeraSpectra system can deliver without damage or destruction of the test sample.